The P-7 Stylus profiler is capable of addressing a wide range of surface measurements and applications:
• Film step height measurements
• Photo resist thickness
• Etched trench depth
• Materials characterization for surface roughness and waviness
• 3D imaging of various surfaces
Sample size up to 150mm. Up to 150mm scan length with 1mm Z-range.
• Film step height measurements
• Photo resist thickness
• Etched trench depth
• Materials characterization for surface roughness and waviness
• 3D imaging of various surfaces
Sample size up to 150mm. Up to 150mm scan length with 1mm Z-range.
3D Profilometry scan of a Nickel.
Step height measurement